smartctl 5.42 2011-10-20 r3458 [x86_64-linux-2.6.18-348.el5] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: FUJITSU MHT2060BS Serial Number: NR0LT562599Y Firmware Version: 034E User Capacity: 60,011,642,880 bytes [60.0 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Fri Jan 11 13:13:00 2013 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART STATUS RETURN: incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 440) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 45) minutes. Conveyance self-test routine recommended polling time: ( 0) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 180888 2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline - 17236250 3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 207 5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000, 0) 7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always - 971 8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 13081570 10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 207 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 155 193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11329 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 28 (Min/Max 20/44) 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 9 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 (0, 6954) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 1 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always - 8180 203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always - 2632795881544 240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 12 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 12 occurred at disk power-on lifetime: 3136 hours (130 days + 16 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 ad 90 aa 40 Error: UNC 1 sectors at LBA = 0x00aa90ad = 11178157 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 01 ad 90 aa 40 00 00:08:44.095 READ DMA EXT 35 00 08 c0 83 ca 40 00 00:08:44.081 WRITE DMA EXT 25 00 01 ad 90 aa 40 00 00:08:39.281 READ DMA EXT 35 00 68 00 d9 0a 40 00 00:08:39.248 WRITE DMA EXT 25 00 00 00 90 aa 40 00 00:08:34.446 READ DMA EXT Error 11 occurred at disk power-on lifetime: 3136 hours (130 days + 16 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 ad 90 aa 40 Error: UNC 1 sectors at LBA = 0x00aa90ad = 11178157 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 01 ad 90 aa 40 00 00:08:39.281 READ DMA EXT 35 00 68 00 d9 0a 40 00 00:08:39.248 WRITE DMA EXT 25 00 00 00 90 aa 40 00 00:08:34.446 READ DMA EXT 25 00 00 00 8e aa 40 00 00:08:34.437 READ DMA EXT 25 00 00 00 8c aa 40 00 00:08:34.429 READ DMA EXT Error 10 occurred at disk power-on lifetime: 3136 hours (130 days + 16 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 53 ad 90 aa 40 Error: UNC 83 sectors at LBA = 0x00aa90ad = 11178157 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 00 90 aa 40 00 00:08:34.446 READ DMA EXT 25 00 00 00 8e aa 40 00 00:08:34.437 READ DMA EXT 25 00 00 00 8c aa 40 00 00:08:34.429 READ DMA EXT 25 00 00 00 8a aa 40 00 00:08:34.420 READ DMA EXT 25 00 00 00 88 aa 40 00 00:08:34.411 READ DMA EXT Error 9 occurred at disk power-on lifetime: 3135 hours (130 days + 15 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 22 de dc 26 40 Error: ICRC, ABRT 34 sectors at LBA = 0x0026dcde = 2546910 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 00 00 00 dc 26 40 00 00:36:57.482 WRITE DMA EXT 35 00 2e 80 de fb 40 00 00:36:57.458 WRITE DMA EXT 35 00 00 00 da 26 40 00 00:36:57.446 WRITE DMA EXT 35 00 00 00 d8 26 40 00 00:36:57.397 WRITE DMA EXT 35 00 00 00 d6 26 40 00 00:36:57.377 WRITE DMA EXT Error 8 occurred at disk power-on lifetime: 3135 hours (130 days + 15 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 22 de 0a 02 40 Error: ICRC, ABRT 34 sectors at LBA = 0x00020ade = 133854 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 00 00 00 0a 02 40 00 00:16:03.666 WRITE DMA EXT 35 00 2e 80 de fb 40 00 00:16:03.632 WRITE DMA EXT 35 00 00 00 08 02 40 00 00:16:03.615 WRITE DMA EXT 35 00 00 00 06 02 40 00 00:16:03.576 WRITE DMA EXT 35 00 00 00 04 02 40 00 00:16:03.553 WRITE DMA EXT SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.